Performance evaluation of an IGBT module by thermal analysis using fiber Bragg grating

Abstract

This paper proposes a new method to estimate the energy losses in insulated gate bipolar transistors (IGBT) modules. The technique is based on measuring the temperature of the semiconductor junction through optical sensors based on fiber Bragg gratings. The IGBT module is monitored through software, enabling a real-time evaluation of performance, which facilitates the analysis of the device in different operating conditions. The results are compared with conventional techniques to validate the method.