Análise de confiabilidade baseada em ensaios acelerados de vida: estudo de caso de lâmpadas incandescentes e LED utilizadas em refrigeradores

Abstract

To meet the growing demand demanded by the consumer market, technology companies and industries from various industries need to develop their products and components in an increasingly short time. In order for this development to be successful, that is, it meets all prerequisites in accordance with current legislation, among others, it is necessary to test them under various conditions and situations to approve it. Normally in laboratories of tests of companies and industries and/or external laboratories specialized in several areas of the knowledge of the Engineering, the main attention is in homologating the product or component through standardized tests, like tests “pass-not pass”, functional, environmental tests , electrical, mechanical, safety, durability. These tests are very important in order to achieve the required minimum qualification, but they are not able to estimate the statistical parameters of a probability distribution and also to understand the failure modes that may occur due to the condition of use over time. In the refrigerator industry, various components such as resistors, compressors, thermostats, electronic boards of others are developed and tested to be integrated into the products. This work proposes use method and techniques for performing accelerated life tests for incandescent and LED lamps, which are part of the refrigerator lighting system. It should be emphasized that the method and techniques of accelerated life tests performed on incandescent lamps and LED lamps can be used in all other components of the refrigerator, but it is worth mentioning that each component has different physical or fault mechanisms and that a new engineering approach must be performed for each case that one wishes to study. The reliability tests of this study were performed under more severe operating and climatic conditions than the normal use condition, in order to reduce the test time. The incandescent lamp, when subjected to the accelerated life tests, had a wearout behavior, with increasing failure rate on time and compatible with the current normative reference. The LED lamp, when subjected to the life data analysis, had a random behavior, with a constant failure rate and incompatible with the current normative reference and with the life data described in the manufacturer's datasheet.